Feature in Chemistry World – “A slice of microscopy”

The article entitled “A slice of microscopy”, describes how two combined microscopy techniques can be used in an “astonishing array of applications”. The combination of Focused Ion Beam-scanning and Scanning Electron Microscopy (FIB-SEM) brings both high-resolution imaging and micromachining.
The group of Bert Weckhuysen used the combined technique to analyze the pore structures of various industrial catalyst particles.

Read the full article:
“A slice of microscopy”, by Emma Davies, published by Chemistry World on June 14, 2017.

Source: website Inorganic Chemistry and Catalysis