The article entitled “A slice of microscopy”, describes how two combined microscopy techniques can be used in an “astonishing array of applications”. The combination of Focused Ion Beam-scanning and Scanning Electron Microscopy (FIB-SEM) brings both high-resolution imaging and micromachining.
The group of Bert Weckhuysen used the combined technique to analyze the pore structures of various industrial catalyst particles.
Read the full article:
“A slice of microscopy”, by Emma Davies, published by Chemistry World on June 14, 2017.