dr. Jiaorong Yan
The processes underlying the surface evolution and mechanisms of plastic film degradation into micro- or nano-plastics remain largely unexplored. In-situ Atomic Force Microscopy (AFM) serves as an effective technique for acquiring topographical and mechanical information regarding material surfaces in a liquid phase. The primary objective of this study is to examine the evolution of the surface topography of plastic films influenced by common solvents with varying pH levels under ambient conditions, utilizing the in-situ AFM characterization technique. Additionally, when feasible, the study will employ Photo-induced Force Microscopy (PiFM) and AFM-Raman spectroscopy to gather further insights into the changes in chemical composition that occur during the degradation process.